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Article: Two Powerful Tests for Parent-of-Origin Effects at Quantitative Trait Loci on the X Chromosome

TitleTwo Powerful Tests for Parent-of-Origin Effects at Quantitative Trait Loci on the X Chromosome
Authors
KeywordsParent-of-origin effects
Quantitative traits
X chromosome
t test
Regression method
Issue Date2019
PublisherS Karger AG. The Journal's web site is located at http://www.karger.com/HHE
Citation
Human Heredity, 2019, v. 83 n. 5, p. 250-273 How to Cite?
AbstractParent-of-origin effects, which describe an occurrence where the expression of a gene depends on its parental origin, are an important phenomenon in epigenetics. Statistical methods for detecting parent-of-origin effects on autosomes have been investigated for 20 years, but the development of statistical methods for detecting parent-of-origin effects on the X chromosome is relatively new. In the literature, a class of Q-XPAT-type tests are the only tests for the parent-of-origin effects for quantitative traits on the X chromosome. In this paper, we propose two simple and powerful classes of tests to detect parent-of-origin effects for quantitative trait values on the X chromosome. The proposed tests can accommodate complete and incomplete nuclear families with any number of daughters. The simulation study shows that our proposed tests produce empirical type I error rates that are close to their respective nominal levels, as well as powers that are larger than those of the Q-XPAT-type tests. The proposed tests are applied to a real data set on Turner’s syndrome, and the proposed tests give a more significant finding than the Q-C-XPAT test.
Persistent Identifierhttp://hdl.handle.net/10722/272973
ISSN
2023 Impact Factor: 1.1
2023 SCImago Journal Rankings: 0.483
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLAU, PY-
dc.contributor.authorYeung, KF-
dc.contributor.authorZhou, JY-
dc.contributor.authorFung, WK-
dc.date.accessioned2019-08-06T09:20:10Z-
dc.date.available2019-08-06T09:20:10Z-
dc.date.issued2019-
dc.identifier.citationHuman Heredity, 2019, v. 83 n. 5, p. 250-273-
dc.identifier.issn0001-5652-
dc.identifier.urihttp://hdl.handle.net/10722/272973-
dc.description.abstractParent-of-origin effects, which describe an occurrence where the expression of a gene depends on its parental origin, are an important phenomenon in epigenetics. Statistical methods for detecting parent-of-origin effects on autosomes have been investigated for 20 years, but the development of statistical methods for detecting parent-of-origin effects on the X chromosome is relatively new. In the literature, a class of Q-XPAT-type tests are the only tests for the parent-of-origin effects for quantitative traits on the X chromosome. In this paper, we propose two simple and powerful classes of tests to detect parent-of-origin effects for quantitative trait values on the X chromosome. The proposed tests can accommodate complete and incomplete nuclear families with any number of daughters. The simulation study shows that our proposed tests produce empirical type I error rates that are close to their respective nominal levels, as well as powers that are larger than those of the Q-XPAT-type tests. The proposed tests are applied to a real data set on Turner’s syndrome, and the proposed tests give a more significant finding than the Q-C-XPAT test.-
dc.languageeng-
dc.publisherS Karger AG. The Journal's web site is located at http://www.karger.com/HHE-
dc.relation.ispartofHuman Heredity-
dc.rightsHuman Heredity. Copyright © S Karger AG.-
dc.rightsThis is the peer-reviewed but unedited manuscript version of the following article: [insert full citation, e.g., Cytogenet Genome Res 2014;142:227–238 (DOI: 10.1159/000361001)]. The final, published version is available at http://www.karger.com/?doi=[insert DOI number]. OR This is the un-reviewed and unedited manuscript version of the following article: [insert full citation, e.g., Cytogenet Genome Res 2014;142:227–238 (DOI: 10.1159/000361001)]. The final, published version is available at http://www.karger.com/?doi=[insert DOI number].-
dc.subjectParent-of-origin effects-
dc.subjectQuantitative traits-
dc.subjectX chromosome-
dc.subjectt test-
dc.subjectRegression method-
dc.titleTwo Powerful Tests for Parent-of-Origin Effects at Quantitative Trait Loci on the X Chromosome-
dc.typeArticle-
dc.identifier.emailFung, WK: wingfung@hkucc.hku.hk-
dc.identifier.authorityFung, WK=rp00696-
dc.identifier.doi10.1159/000496987-
dc.identifier.pmid30959502-
dc.identifier.scopuseid_2-s2.0-85064330344-
dc.identifier.hkuros300022-
dc.identifier.volume83-
dc.identifier.issue5-
dc.identifier.spage250-
dc.identifier.epage273-
dc.identifier.isiWOS:000468936000060-
dc.publisher.placeSwitzerland-
dc.identifier.issnl0001-5652-

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