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Article: Microspectroscopy on perovskite-based superlenses [Invited]

TitleMicrospectroscopy on perovskite-based superlenses [Invited]
Authors
Kehr, Susanne C.Yu, PuLiu, YongminParzefall, MarkusKhan, Asif I.Jacob, RainerWenzel, Marc Tobiasvon Ribbeck, Hans GeorgHelm, ManfredZhang, XiangEng, Lukas M.Ramesh, Ramamoorthy
Issue Date2011
Citation
Optical Materials Express, 2011, v. 1, n. 5, p. 1051-1060 How to Cite?
DOI: http://dx.doi.org/10.1364/OME.1.001051
AbstractSuperlenses create sub-diffraction-limit images by reconstructing the evanescent fields arising from an object. We study the lateral, vertical, and spectral field distribution of three different perovskite-based superlenses by means of scattering-type near-field microscopy. Subdiffraction-limit resolution is observed for all samples with an image contrast depending on losses such as scattering and absorption. For the three lenses superlensing is observed at slightly different frequencies resulting in an overall broad frequency range of 3.6 THz around 20 THz. © 2011 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/257103
ISI Accession Number ID
WOS:000299048500026

 

DC FieldValueLanguage
dc.contributor.authorKehr, Susanne C.-
dc.contributor.authorYu, Pu-
dc.contributor.authorLiu, Yongmin-
dc.contributor.authorParzefall, Markus-
dc.contributor.authorKhan, Asif I.-
dc.contributor.authorJacob, Rainer-
dc.contributor.authorWenzel, Marc Tobias-
dc.contributor.authorvon Ribbeck, Hans Georg-
dc.contributor.authorHelm, Manfred-
dc.contributor.authorZhang, Xiang-
dc.contributor.authorEng, Lukas M.-
dc.contributor.authorRamesh, Ramamoorthy-
dc.date.accessioned2018-07-24T08:58:51Z-
dc.date.available2018-07-24T08:58:51Z-
dc.date.issued2011-
dc.identifier.citationOptical Materials Express, 2011, v. 1, n. 5, p. 1051-1060-
dc.identifier.urihttp://hdl.handle.net/10722/257103-
dc.description.abstractSuperlenses create sub-diffraction-limit images by reconstructing the evanescent fields arising from an object. We study the lateral, vertical, and spectral field distribution of three different perovskite-based superlenses by means of scattering-type near-field microscopy. Subdiffraction-limit resolution is observed for all samples with an image contrast depending on losses such as scattering and absorption. For the three lenses superlensing is observed at slightly different frequencies resulting in an overall broad frequency range of 3.6 THz around 20 THz. © 2011 Optical Society of America.-
dc.languageeng-
dc.relation.ispartofOptical Materials Express-
dc.titleMicrospectroscopy on perovskite-based superlenses [Invited]-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1364/OME.1.001051-
dc.identifier.scopuseid_2-s2.0-84861509296-
dc.identifier.volume1-
dc.identifier.issue5-
dc.identifier.spage1051-
dc.identifier.epage1060-
dc.identifier.eissn2159-3930-
dc.identifier.isiWOS:000299048500026-
dc.identifier.issnl2159-3930-

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