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Conference Paper: Imaging properties of a metamaterial superlens

TitleImaging properties of a metamaterial superlens
Authors
Fang, N.Zhang, Xiang
KeywordsSlabs
Optical propagation
Optical refraction
Permeability
Permittivity
Focusing
Image resolution
Lenses
Metamaterials
Optical imaging
Issue Date2002
Citation
Proceedings of the IEEE Conference on Nanotechnology, 2002, v. 2002-January, p. 225-228 How to Cite?
DOI: http://dx.doi.org/10.1109/NANO.2002.1032233
Abstract© 2002 IEEE. The subwavelength imaging quality of a metamaterial superlens is studied numerically in the wavevector domain. Examples of image compression and magnification are given and resolution limits are discussed. A minimal resolution of λ/6 is obtained using a 36 nm silver film at 364 nm wavelength. The simulation also demonstrates the power flux is no longer a good measure to determine the focal plane of a superlens due the elevated field strength at the exit side of the metamaterial slab.
Persistent Identifierhttp://hdl.handle.net/10722/256915
ISSN
1944-9399
2020 SCImago Journal Rankings: 0.120

 

DC FieldValueLanguage
dc.contributor.authorFang, N.-
dc.contributor.authorZhang, Xiang-
dc.date.accessioned2018-07-24T08:58:19Z-
dc.date.available2018-07-24T08:58:19Z-
dc.date.issued2002-
dc.identifier.citationProceedings of the IEEE Conference on Nanotechnology, 2002, v. 2002-January, p. 225-228-
dc.identifier.issn1944-9399-
dc.identifier.urihttp://hdl.handle.net/10722/256915-
dc.description.abstract© 2002 IEEE. The subwavelength imaging quality of a metamaterial superlens is studied numerically in the wavevector domain. Examples of image compression and magnification are given and resolution limits are discussed. A minimal resolution of λ/6 is obtained using a 36 nm silver film at 364 nm wavelength. The simulation also demonstrates the power flux is no longer a good measure to determine the focal plane of a superlens due the elevated field strength at the exit side of the metamaterial slab.-
dc.languageeng-
dc.relation.ispartofProceedings of the IEEE Conference on Nanotechnology-
dc.subjectSlabs-
dc.subjectOptical propagation-
dc.subjectOptical refraction-
dc.subjectPermeability-
dc.subjectPermittivity-
dc.subjectFocusing-
dc.subjectImage resolution-
dc.subjectLenses-
dc.subjectMetamaterials-
dc.subjectOptical imaging-
dc.titleImaging properties of a metamaterial superlens-
dc.typeConference_Paper-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NANO.2002.1032233-
dc.identifier.scopuseid_2-s2.0-2942658536-
dc.identifier.volume2002-January-
dc.identifier.spage225-
dc.identifier.epage228-
dc.identifier.eissn1944-9380-

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