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- Publisher Website: 10.1364/OE.24.000545
- Scopus: eid_2-s2.0-84962162162
- WOS: WOS:000368004800054
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Article: Sensitive method for measuring third order nonlinearities in compact dielectric and hybrid plasmonic waveguides
Title | Sensitive method for measuring third order nonlinearities in compact dielectric and hybrid plasmonic waveguides |
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Authors | |
Issue Date | 2016 |
Citation | Optics Express, 2016, v. 24, n. 1, p. 545-554 How to Cite? |
Abstract | © 2016 Optical Society of America. We demonstrate a sensitive method for the nonlinear optical characterization of micrometer long waveguides, and apply it to typical silicon-on-insulator nanowires and to hybrid plasmonic waveguides. We demonstrate that our method can detect extremely small nonlinear phase shifts, as low as 7.5·10-4rad. The high sensitivity achieved imparts an advantage when investigating the nonlinear behavior of metallic structures as their short propagation distances complicates the task for conventional methods. Our results constitute the first experimental observation of χ(3)nonlinearities in the hybrid plasmonic platform and is important to test claims of hybrid plasmonic structures as candidates for efficient nonlinear optical devices. |
Persistent Identifier | http://hdl.handle.net/10722/256776 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Diaz, F. J. | - |
dc.contributor.author | Hatakeyama, T. | - |
dc.contributor.author | Rho, J. | - |
dc.contributor.author | Wang, Y. | - |
dc.contributor.author | O'Brien, K. | - |
dc.contributor.author | Zhang, X. | - |
dc.contributor.author | Martijn De Sterke, C. | - |
dc.contributor.author | Kuhlmey, B. T. | - |
dc.contributor.author | Palomba, S. | - |
dc.date.accessioned | 2018-07-24T08:57:53Z | - |
dc.date.available | 2018-07-24T08:57:53Z | - |
dc.date.issued | 2016 | - |
dc.identifier.citation | Optics Express, 2016, v. 24, n. 1, p. 545-554 | - |
dc.identifier.uri | http://hdl.handle.net/10722/256776 | - |
dc.description.abstract | © 2016 Optical Society of America. We demonstrate a sensitive method for the nonlinear optical characterization of micrometer long waveguides, and apply it to typical silicon-on-insulator nanowires and to hybrid plasmonic waveguides. We demonstrate that our method can detect extremely small nonlinear phase shifts, as low as 7.5·10-4rad. The high sensitivity achieved imparts an advantage when investigating the nonlinear behavior of metallic structures as their short propagation distances complicates the task for conventional methods. Our results constitute the first experimental observation of χ(3)nonlinearities in the hybrid plasmonic platform and is important to test claims of hybrid plasmonic structures as candidates for efficient nonlinear optical devices. | - |
dc.language | eng | - |
dc.relation.ispartof | Optics Express | - |
dc.title | Sensitive method for measuring third order nonlinearities in compact dielectric and hybrid plasmonic waveguides | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1364/OE.24.000545 | - |
dc.identifier.scopus | eid_2-s2.0-84962162162 | - |
dc.identifier.volume | 24 | - |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 545 | - |
dc.identifier.epage | 554 | - |
dc.identifier.eissn | 1094-4087 | - |
dc.identifier.isi | WOS:000368004800054 | - |
dc.identifier.issnl | 1094-4087 | - |