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Article: Effect of a semiconductor electrode on the tunneling electroresistance in ferroelectric tunneling junction

TitleEffect of a semiconductor electrode on the tunneling electroresistance in ferroelectric tunneling junction
Authors
Issue Date2016
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2016, v. 109 n. 16, article no. 163501, p. 1-6 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/242254
ISSN
2017 Impact Factor: 3.495
2015 SCImago Journal Rankings: 1.105
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWang, XJ-
dc.contributor.authorSong, BQ-
dc.contributor.authorTao, L-
dc.contributor.authorWen, JH-
dc.contributor.authorZhang, LL-
dc.contributor.authorZhang, Y-
dc.contributor.authorLv, Z-
dc.contributor.authorTang, J-
dc.contributor.authorSui, Y-
dc.contributor.authorSong, B-
dc.contributor.authorHan, XF-
dc.date.accessioned2017-07-24T01:37:21Z-
dc.date.available2017-07-24T01:37:21Z-
dc.date.issued2016-
dc.identifier.citationApplied Physics Letters, 2016, v. 109 n. 16, article no. 163501, p. 1-6-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/242254-
dc.languageeng-
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/-
dc.relation.ispartofApplied Physics Letters-
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 2016, v. 109 n. 16, article no. 163501, p. 1-6 and may be found at https://doi.org/10.1063/1.4965708-
dc.titleEffect of a semiconductor electrode on the tunneling electroresistance in ferroelectric tunneling junction-
dc.typeArticle-
dc.identifier.emailTao, L: lltao@hku.hk-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4965708-
dc.identifier.hkuros273274-
dc.identifier.volume109-
dc.identifier.issue16-
dc.identifier.spagearticle no. 163501, p. 1-
dc.identifier.epagearticle no. 163501, p. 6-
dc.identifier.isiWOS:000386933200037-
dc.publisher.placeUnited States-

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