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Conference Paper: Applying machine learning to PLC event detection and logging for forensic purpose

TitleApplying machine learning to PLC event detection and logging for forensic purpose
Authors
Yau, KKChow, KP
Issue Date2017
Citation
The 13th Annual IFIP WG 11.9 International Conference on Digital Forensics, Orlando, FL., 30 January-1 February 2017. How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/237681

 

DC FieldValueLanguage
dc.contributor.authorYau, KK-
dc.contributor.authorChow, KP-
dc.date.accessioned2017-01-19T01:18:54Z-
dc.date.available2017-01-19T01:18:54Z-
dc.date.issued2017-
dc.identifier.citationThe 13th Annual IFIP WG 11.9 International Conference on Digital Forensics, Orlando, FL., 30 January-1 February 2017.-
dc.identifier.urihttp://hdl.handle.net/10722/237681-
dc.languageeng-
dc.relation.ispartof13th Annual IFIP WG 11.9 International Conference on Digital Forensics-
dc.titleApplying machine learning to PLC event detection and logging for forensic purpose-
dc.typeConference_Paper-
dc.identifier.emailChow, KP: chow@cs.hku.hk-
dc.identifier.authorityChow, KP=rp00111-
dc.identifier.hkuros271059-
dc.description.otherThe 13th Annual IFIP WG 11.9 International Conference on Digital Forensics, Orlando, FL., 30 January-1 February 2017.-

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