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Article: Back-scattered and secondary electron images of scanning electron microscopy in dentistry: A new method for surface analysis

TitleBack-scattered and secondary electron images of scanning electron microscopy in dentistry: A new method for surface analysis
Authors
KeywordsBack-scattered
Secondary electron
Scanning electron microscopy
Endodontics
Issue Date2012
Citation
Acta Odontologica Scandinavica, 2012, v. 70, n. 6, p. 603-609 How to Cite?
AbstractObjective: A scanning electron microscope (SEM) is a popular tool for investigating the root canal surface to visualize dentinal tubules, the smear layer and various root canal filling materials in endodontics. Most of the SEM micrographs taken in endodontic research are in secondary electrons (SE) mode, in which the topographic view of a subject can be demonstrated without giving any information about the real structure. Back-scattered electron (BSE) images are also used, which reveal some information about the internal structure while providing no topographic details. The aim of this study was to investigate the possibility of using back-scattered (BSE) and secondary electron (SE) modeofscanning electron microscopy (SEM) together for obtaining detailed information about biomaterials in relation to dental structures. Materials and methods: Mesiobuccal roots of four permanent maxillary molars were cleaned and shaped with rotary instruments. Two samples were obturated with guttapercha and sealer. After 2 weeks, gutta-perch was removed using rotary instruments and chloroform. In the other phase of the study, white mineral trioxide aggregate was mixed and packed into five glass tubes and exposed to blood, deionized water, synthetic tissue fluid and egg white. All the samples were prepared for visualization under SE and BSE modes of SEM to observe the characteristics of material remnants and surface structures. Results: BSE mode illustrated different grey scale views which made it possible to differentiate dentin chips from filling material remnants on the surface of root canal dentin. In addition, SE mode focusedonimage topography, while a BSE detector showed new texture formationonthe surface of white mineral trioxide aggregate exposed to proteinaceous fluids such as blood or egg white. Conclusions: Mapping BSE and SE micrographs helped ustobetter understand the structure of materials on the surface ofroot canal dentin and MTA. Moreover, analysis of structure of materials on the surface of root canal dentine and MTA can be performed better by mapping of BSE and SE micrographs. © 2012 Informa Healthcare.
Persistent Identifierhttp://hdl.handle.net/10722/236008
ISSN
2023 Impact Factor: 1.4
2023 SCImago Journal Rankings: 0.569
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorSaghiri, Mohammad Ali-
dc.contributor.authorAsgar, Kamal-
dc.contributor.authorLotfi, Mehrdad-
dc.contributor.authorKaramifar, Kasra-
dc.contributor.authorSaghiri, Ali Mohammad-
dc.contributor.authorNeelakantan, Prasanna-
dc.contributor.authorGutmann, James L.-
dc.contributor.authorSheibaninia, Ahmad-
dc.date.accessioned2016-11-10T07:11:58Z-
dc.date.available2016-11-10T07:11:58Z-
dc.date.issued2012-
dc.identifier.citationActa Odontologica Scandinavica, 2012, v. 70, n. 6, p. 603-609-
dc.identifier.issn0001-6357-
dc.identifier.urihttp://hdl.handle.net/10722/236008-
dc.description.abstractObjective: A scanning electron microscope (SEM) is a popular tool for investigating the root canal surface to visualize dentinal tubules, the smear layer and various root canal filling materials in endodontics. Most of the SEM micrographs taken in endodontic research are in secondary electrons (SE) mode, in which the topographic view of a subject can be demonstrated without giving any information about the real structure. Back-scattered electron (BSE) images are also used, which reveal some information about the internal structure while providing no topographic details. The aim of this study was to investigate the possibility of using back-scattered (BSE) and secondary electron (SE) modeofscanning electron microscopy (SEM) together for obtaining detailed information about biomaterials in relation to dental structures. Materials and methods: Mesiobuccal roots of four permanent maxillary molars were cleaned and shaped with rotary instruments. Two samples were obturated with guttapercha and sealer. After 2 weeks, gutta-perch was removed using rotary instruments and chloroform. In the other phase of the study, white mineral trioxide aggregate was mixed and packed into five glass tubes and exposed to blood, deionized water, synthetic tissue fluid and egg white. All the samples were prepared for visualization under SE and BSE modes of SEM to observe the characteristics of material remnants and surface structures. Results: BSE mode illustrated different grey scale views which made it possible to differentiate dentin chips from filling material remnants on the surface of root canal dentin. In addition, SE mode focusedonimage topography, while a BSE detector showed new texture formationonthe surface of white mineral trioxide aggregate exposed to proteinaceous fluids such as blood or egg white. Conclusions: Mapping BSE and SE micrographs helped ustobetter understand the structure of materials on the surface ofroot canal dentin and MTA. Moreover, analysis of structure of materials on the surface of root canal dentine and MTA can be performed better by mapping of BSE and SE micrographs. © 2012 Informa Healthcare.-
dc.languageeng-
dc.relation.ispartofActa Odontologica Scandinavica-
dc.subjectBack-scattered-
dc.subjectSecondary electron-
dc.subjectScanning electron microscopy-
dc.subjectEndodontics-
dc.titleBack-scattered and secondary electron images of scanning electron microscopy in dentistry: A new method for surface analysis-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.3109/00016357.2011.645057-
dc.identifier.pmid22251068-
dc.identifier.scopuseid_2-s2.0-84867281444-
dc.identifier.volume70-
dc.identifier.issue6-
dc.identifier.spage603-
dc.identifier.epage609-
dc.identifier.eissn1502-3850-
dc.identifier.isiWOS:000309667400023-
dc.identifier.issnl0001-6357-

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