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  Patent History
  • Application
    US 12/4511570 2014-10-10
  • Granted
    US 20150168214 2015-06-18

granted patent: Wavelength-Encoded Tomography

TitleWavelength-Encoded Tomography
Granted PatentUS 20150168214
Granted Date2015-06-18
Priority Date2014-10-10 US 12/4511570
2013-10-11 US 12/1890048P
Inventors
Issue Date2015
Citation
US Patent US 20150168214. Washington, DC: US Patent and Trademark Office (USPTO), 2015 How to Cite?
AbstractSystems and methods for non-invasive optical imaging are provided. One or more time-lenses can be utilized to perform an optical Fourier transform, and the time-to-wavelength conversion can generate a wavelength-encoded image of optical scattering, analogous to optical coherence tomography. This optical Fourier transform provides improved axial resolution and simplifies digital signal processing after data acquisition.
Persistent Identifierhttp://hdl.handle.net/10722/221226

 

DC FieldValueLanguage
dc.date.accessioned2015-11-05T03:51:31Z-
dc.date.available2015-11-05T03:51:31Z-
dc.date.issued2015-
dc.identifier.citationUS Patent US 20150168214. Washington, DC: US Patent and Trademark Office (USPTO), 2015-
dc.identifier.urihttp://hdl.handle.net/10722/221226-
dc.description.abstractSystems and methods for non-invasive optical imaging are provided. One or more time-lenses can be utilized to perform an optical Fourier transform, and the time-to-wavelength conversion can generate a wavelength-encoded image of optical scattering, analogous to optical coherence tomography. This optical Fourier transform provides improved axial resolution and simplifies digital signal processing after data acquisition.-
dc.titleWavelength-Encoded Tomography-
dc.typePatent-
dc.identifier.authorityWONG KENNETH KIN YIP=rp00189-
dc.description.naturepublished_or_final_version-
dc.contributor.inventorWONG KENNETH KIN YIP-
dc.contributor.inventorZHANG CHI-
patents.identifier.applicationUS 12/4511570-
patents.identifier.grantedUS 20150168214-
patents.description.assigneeUNIV HONG KONG [CN] -
patents.description.countryUnited States of America -
patents.date.granted2015-06-18-
patents.identifier.hkutechidEEE-2013-00474-1-
patents.date.application2014-10-10-
patents.date.priority2014-10-10 US 12/4511570-
patents.date.priority2013-10-11 US 12/1890048P-
patents.description.ccus-
patents.relation.familyWO 2015051767 (A2) 2015-04-16 -
patents.description.kindA1-
patents.typePatent_granted-

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