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- Publisher Website: 10.1080/15599612.2014.916017
- Scopus: eid_2-s2.0-84902958803
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Article: Efficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing
Title | Efficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing |
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Authors | |
Keywords | block matrix part arithmetic block-dividing method compressive sensing scanning ion conductance microscopy block compressive sensing |
Issue Date | 2014 |
Citation | International Journal of Optomechatronics, 2014, v. 8, n. 3, p. 218-227 How to Cite? |
Abstract | Scanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it is widely used in imaging soft samples for many distinctive advantages. However, the scanning speed of SICM is much slower than other SPMs. Compressive sensing (CS) could improve scanning speed tremendously by breaking through the Shannon sampling theorem, but it still requires too much time in image reconstruction. Block compressive sensing can be applied to SICM imaging to further reduce the reconstruction time of sparse signals, and it has another unique application that it can achieve the function of image real-time display in SICM imaging. In this article, a new method of dividing blocks and a new matrix arithmetic operation were proposed to build the block compressive sensing model, and several experiments were carried out to verify the superiority of block compressive sensing in reducing imaging time and real-time display in SICM imaging. © 2014 Copyright Taylor & Francis Group, LLC. |
Persistent Identifier | http://hdl.handle.net/10722/213414 |
ISSN | 2023 Impact Factor: 6.7 2023 SCImago Journal Rankings: 1.314 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Li, Gongxin | - |
dc.contributor.author | Li, Peng | - |
dc.contributor.author | Wang, Yuechao | - |
dc.contributor.author | Wang, Wenxue | - |
dc.contributor.author | Xi, Ning | - |
dc.contributor.author | Liu, Lianqing | - |
dc.date.accessioned | 2015-07-28T04:07:12Z | - |
dc.date.available | 2015-07-28T04:07:12Z | - |
dc.date.issued | 2014 | - |
dc.identifier.citation | International Journal of Optomechatronics, 2014, v. 8, n. 3, p. 218-227 | - |
dc.identifier.issn | 1559-9612 | - |
dc.identifier.uri | http://hdl.handle.net/10722/213414 | - |
dc.description.abstract | Scanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it is widely used in imaging soft samples for many distinctive advantages. However, the scanning speed of SICM is much slower than other SPMs. Compressive sensing (CS) could improve scanning speed tremendously by breaking through the Shannon sampling theorem, but it still requires too much time in image reconstruction. Block compressive sensing can be applied to SICM imaging to further reduce the reconstruction time of sparse signals, and it has another unique application that it can achieve the function of image real-time display in SICM imaging. In this article, a new method of dividing blocks and a new matrix arithmetic operation were proposed to build the block compressive sensing model, and several experiments were carried out to verify the superiority of block compressive sensing in reducing imaging time and real-time display in SICM imaging. © 2014 Copyright Taylor & Francis Group, LLC. | - |
dc.language | eng | - |
dc.relation.ispartof | International Journal of Optomechatronics | - |
dc.subject | block matrix part arithmetic | - |
dc.subject | block-dividing method | - |
dc.subject | compressive sensing | - |
dc.subject | scanning ion conductance microscopy | - |
dc.subject | block compressive sensing | - |
dc.title | Efficient Imaging and Real-Time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1080/15599612.2014.916017 | - |
dc.identifier.scopus | eid_2-s2.0-84902958803 | - |
dc.identifier.volume | 8 | - |
dc.identifier.issue | 3 | - |
dc.identifier.spage | 218 | - |
dc.identifier.epage | 227 | - |
dc.identifier.eissn | 1559-9620 | - |
dc.identifier.isi | WOS:000338287400006 | - |
dc.identifier.issnl | 1559-9612 | - |