File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Rapid 3D surface profile measurement of industrial parts using two-level structured light patterns

TitleRapid 3D surface profile measurement of industrial parts using two-level structured light patterns
Authors
KeywordsMeasurement
Calibration
Structured light
Issue Date2011
Citation
Optics and Lasers in Engineering, 2011, v. 49, n. 7, p. 907-914 How to Cite?
AbstractThis paper aims to present a rapid 3D shape measurement system based on novel monochromatic structured light patterns. The system consists of projectors shooting the fringe patterns onto the inspected parts and cameras recording the corresponding distorted images. Using the two-level fringe patterns, the correspondence between the projector image and camera image can be established with sub-pixel accuracy. The two-level pattern is based on three spatiotemporal binary stripes, in which the value of the stripe boundary (first-level coding) is determined by the two adjacent stripes patterns over time and the codeword of the strip boundary (second-level coding) depends on its values and neighbor boundary values in space. The proposed pattern is robust to ambience light variation and part texture. Moreover, the occlusion can be overcome and high density measurement can be achieved. Experiments with different 3D parts are conducted to evaluate the robustness and accuracy of the inspection system using the two-level patterns. The results show that the system has desired properties of high accuracy, high density, rapid acquisition, and robustness, which are essential for industrial application. © 2011 Elsevier Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/213174
ISSN
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 1.009
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorXu, Jing-
dc.contributor.authorXi, Ning-
dc.contributor.authorZhang, Chi-
dc.contributor.authorZhao, Jianguo-
dc.contributor.authorGao, Bingtuan-
dc.contributor.authorShi, Quan-
dc.date.accessioned2015-07-28T04:06:23Z-
dc.date.available2015-07-28T04:06:23Z-
dc.date.issued2011-
dc.identifier.citationOptics and Lasers in Engineering, 2011, v. 49, n. 7, p. 907-914-
dc.identifier.issn0143-8166-
dc.identifier.urihttp://hdl.handle.net/10722/213174-
dc.description.abstractThis paper aims to present a rapid 3D shape measurement system based on novel monochromatic structured light patterns. The system consists of projectors shooting the fringe patterns onto the inspected parts and cameras recording the corresponding distorted images. Using the two-level fringe patterns, the correspondence between the projector image and camera image can be established with sub-pixel accuracy. The two-level pattern is based on three spatiotemporal binary stripes, in which the value of the stripe boundary (first-level coding) is determined by the two adjacent stripes patterns over time and the codeword of the strip boundary (second-level coding) depends on its values and neighbor boundary values in space. The proposed pattern is robust to ambience light variation and part texture. Moreover, the occlusion can be overcome and high density measurement can be achieved. Experiments with different 3D parts are conducted to evaluate the robustness and accuracy of the inspection system using the two-level patterns. The results show that the system has desired properties of high accuracy, high density, rapid acquisition, and robustness, which are essential for industrial application. © 2011 Elsevier Ltd. All rights reserved.-
dc.languageeng-
dc.relation.ispartofOptics and Lasers in Engineering-
dc.subjectMeasurement-
dc.subjectCalibration-
dc.subjectStructured light-
dc.titleRapid 3D surface profile measurement of industrial parts using two-level structured light patterns-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.optlaseng.2011.02.010-
dc.identifier.scopuseid_2-s2.0-79957731210-
dc.identifier.volume49-
dc.identifier.issue7-
dc.identifier.spage907-
dc.identifier.epage914-
dc.identifier.isiWOS:000291078500025-
dc.identifier.issnl0143-8166-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats