File Download
There are no files associated with this item.
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1109/TNANO.2008.2008024
- Scopus: eid_2-s2.0-62449236685
- WOS: WOS:000264343600016
- Find via
Supplementary
- Citations:
- Appears in Collections:
Article: Design, manufacturing, and testing of single-carbon-nanotube-based infrared sensors
Title | Design, manufacturing, and testing of single-carbon-nanotube-based infrared sensors |
---|---|
Authors | |
Keywords | Nanomanufacturing Atomic force microscopy (AFM) Carbon nanotube (CNT) IR sensor Nanomanipulation |
Issue Date | 2009 |
Citation | IEEE Transactions on Nanotechnology, 2009, v. 8, n. 2, p. 245-251 How to Cite? |
Abstract | As a 1-D nanostructural material, carbon nanotube (CNT) has attracted lot of attention and has been used to build various nanoelectronic devices due to its unique electronic properties. In this paper, a reliable and efficient nanomanufacturing process was developed for building single-CNT-based nanodevices by depositing the CNTs on the substrate surface and then aligning them to bridge the electrode gap using the atomic force microscopy (AFM) based nanomanipulation. With this technology, single CNT-based IR sensors have been fabricated for investigating CNTs electronic and photonic properties. The fabrication of single-CNT-based IR sensors demonstrated the reliability and efficiency of the nanomanufacturing process. Experimental tests on single-multiwalled-CNT-based IR sensors have shown much larger photocurrent and quantum efficiency than other reported studies. It has also been shown that a high signal to dark current ratio can be accomplished by single-walled-CNT (SWNT) based IR sensors. Moreover, the testing of SWNT-bundle-based IR sensors verified that the performance of CNT bundle/film-based nanoelectronic devices was limited by the mixing of semiconducting CNTs and metallic CNTs, as well as the unstable CNTCNT junctions in a CNT bundle or network. © 2006 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/213041 |
ISSN | 2023 Impact Factor: 2.1 2023 SCImago Journal Rankings: 0.435 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhang, Jiangbo | - |
dc.contributor.author | Xi, Ning | - |
dc.contributor.author | Chen, Hongzhi | - |
dc.contributor.author | Lai, King Wai Chiu | - |
dc.contributor.author | Li, Guangyong | - |
dc.contributor.author | Wejinya, Uchechukwu C. | - |
dc.date.accessioned | 2015-07-28T04:05:52Z | - |
dc.date.available | 2015-07-28T04:05:52Z | - |
dc.date.issued | 2009 | - |
dc.identifier.citation | IEEE Transactions on Nanotechnology, 2009, v. 8, n. 2, p. 245-251 | - |
dc.identifier.issn | 1536-125X | - |
dc.identifier.uri | http://hdl.handle.net/10722/213041 | - |
dc.description.abstract | As a 1-D nanostructural material, carbon nanotube (CNT) has attracted lot of attention and has been used to build various nanoelectronic devices due to its unique electronic properties. In this paper, a reliable and efficient nanomanufacturing process was developed for building single-CNT-based nanodevices by depositing the CNTs on the substrate surface and then aligning them to bridge the electrode gap using the atomic force microscopy (AFM) based nanomanipulation. With this technology, single CNT-based IR sensors have been fabricated for investigating CNTs electronic and photonic properties. The fabrication of single-CNT-based IR sensors demonstrated the reliability and efficiency of the nanomanufacturing process. Experimental tests on single-multiwalled-CNT-based IR sensors have shown much larger photocurrent and quantum efficiency than other reported studies. It has also been shown that a high signal to dark current ratio can be accomplished by single-walled-CNT (SWNT) based IR sensors. Moreover, the testing of SWNT-bundle-based IR sensors verified that the performance of CNT bundle/film-based nanoelectronic devices was limited by the mixing of semiconducting CNTs and metallic CNTs, as well as the unstable CNTCNT junctions in a CNT bundle or network. © 2006 IEEE. | - |
dc.language | eng | - |
dc.relation.ispartof | IEEE Transactions on Nanotechnology | - |
dc.subject | Nanomanufacturing | - |
dc.subject | Atomic force microscopy (AFM) | - |
dc.subject | Carbon nanotube (CNT) | - |
dc.subject | IR sensor | - |
dc.subject | Nanomanipulation | - |
dc.title | Design, manufacturing, and testing of single-carbon-nanotube-based infrared sensors | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/TNANO.2008.2008024 | - |
dc.identifier.scopus | eid_2-s2.0-62449236685 | - |
dc.identifier.volume | 8 | - |
dc.identifier.issue | 2 | - |
dc.identifier.spage | 245 | - |
dc.identifier.epage | 251 | - |
dc.identifier.isi | WOS:000264343600016 | - |
dc.identifier.issnl | 1536-125X | - |