Fast algorithm for blind estimation of tip shape for atomic force microscope

Abstract

Imaging quality of nano scales produced by atomic force microscope (AFM) seriously depends on the shape of the probe tip. Commonly, the distortions will be induced when the probe tip scans material surfaces. This situation could hinder nano-observation and nano-operation. In order to obtain the actual observing image, one of the existing methods for solving this problem is the blind evaluation of the probe tips. Through this method, the shape of a probe tip can be described, and then the scanned image produced by the probe can be improved by the known tip shape. Since the traditional algorithm of tip blind evaluation is extremely time-consuming, a new algorithm that can significantly reduce the computational time, is presented in this paper. The experimental results demonstrate that the new algorithm is much more efficient compared to the existing methods. © 2008 IEEE.