"Videolized" atomic force microscopy for interactive nanomanipulation and nanoassembly

Abstract

The main problem in nanomanipulation and nanoassembly using atomic force microscopy (AFM) is its lack of real-time visual feedback during manipulation. Fortunately, this problem has been solved by our recently developed augmented reality system, which includes real-time force feedback and real-time "videolized" visual feedback. Through the augmented reality interface, the operator can monitor real-time changes of the nanoenvironment during nanomanipulation through a movie-like AFM image. In this paper, the behavior of some nanowires under pushing is theoretically analyzed and the interaction among the tip, substrate, and nanowires has been modeled. Based on these models, the real-time interactive forces can be used to locally update the AFM image in order to obtain movie-like visual feedback in video frame rate. This augmented reality enhanced system capable of manipulation of nanoparticles and nanowires helps the operator to perform several operations without the need of a new image scan. AFM-based nanoassembly becomes feasible through this newly developed system. © 2005 IEEE.