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Article: Improved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design

TitleImproved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family design
Authors
KeywordsCombinatorial group testing
High-speed quantum key distribution
Key integrity checking
Strong selective family
Issue Date2014
PublisherSpringer. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=1570-0755
Citation
Quantum Information Processing, 2014, v. 13, Issue 6, p. 1425-1435 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/204725
ISSN
2021 Impact Factor: 1.965
2020 SCImago Journal Rankings: 0.583
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorFang, Jen_US
dc.contributor.authorJiang, Len_US
dc.contributor.authorRen, Ken_US
dc.contributor.authorLuo, Yen_US
dc.contributor.authorChen, Zen_US
dc.contributor.authorLiu, Wen_US
dc.contributor.authorWang, Xen_US
dc.contributor.authorNiu, Xen_US
dc.contributor.authorYiu, SMen_US
dc.contributor.authorHui, CKen_US
dc.date.accessioned2014-09-20T00:31:59Z-
dc.date.available2014-09-20T00:31:59Z-
dc.date.issued2014en_US
dc.identifier.citationQuantum Information Processing, 2014, v. 13, Issue 6, p. 1425-1435en_US
dc.identifier.issn1570-0755-
dc.identifier.urihttp://hdl.handle.net/10722/204725-
dc.languageengen_US
dc.publisherSpringer. The Journal's web site is located at http://springerlink.metapress.com/openurl.asp?genre=journal&issn=1570-0755en_US
dc.relation.ispartofQuantum Information Processingen_US
dc.rightsThe original publication is available at www.springerlink.comen_US
dc.subjectCombinatorial group testing-
dc.subjectHigh-speed quantum key distribution-
dc.subjectKey integrity checking-
dc.subjectStrong selective family-
dc.titleImproved key integrity checking for high-speed quantum key distribution using combinatorial group testing with strongly selective family designen_US
dc.typeArticleen_US
dc.identifier.emailFang, J: jbfang@cs.hku.hken_US
dc.identifier.emailYiu, SM: smyiu@cs.hku.hken_US
dc.identifier.emailHui, CK: hui@cs.hku.hken_US
dc.identifier.authorityYiu, SM=rp00207en_US
dc.identifier.authorityHui, CK=rp00120en_US
dc.identifier.doi10.1007/s11128-014-0737-7-
dc.identifier.scopuseid_2-s2.0-84904051896-
dc.identifier.hkuros240376en_US
dc.identifier.spage1425en_US
dc.identifier.epage1435en_US
dc.identifier.eissn1573-1332-
dc.identifier.isiWOS:000336404800010-
dc.publisher.placeUSAen_US
dc.identifier.issnl1570-0755-

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