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Article: Investigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imaging

TitleInvestigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imaging
Authors
Luo, ZLau, HKChan, PKLLeung, CW
KeywordsNonvolatile memories
Pr0.7Ca0.3MnO3 (PCMO)
resistive switching (RS)
thermal imaging
Issue Date2014
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
IEEE Transactions on Magnetics, 2014, v. 50 n. 7, article no. 3000804 How to Cite?
DOI: http://dx.doi.org/10.1109/TMAG.2013.2293780
Persistent Identifierhttp://hdl.handle.net/10722/202995
ISSN
0018-9464
2023 Impact Factor: 2.1
2023 SCImago Journal Rankings: 0.729
ISI Accession Number ID
WOS:000343034700011

 

DC FieldValueLanguage
dc.contributor.authorLuo, Zen_US
dc.contributor.authorLau, HKen_US
dc.contributor.authorChan, PKLen_US
dc.contributor.authorLeung, CWen_US
dc.date.accessioned2014-09-19T11:07:38Z-
dc.date.available2014-09-19T11:07:38Z-
dc.date.issued2014en_US
dc.identifier.citationIEEE Transactions on Magnetics, 2014, v. 50 n. 7, article no. 3000804en_US
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10722/202995-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20-
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.subjectNonvolatile memories-
dc.subjectPr0.7Ca0.3MnO3 (PCMO)-
dc.subjectresistive switching (RS)-
dc.subjectthermal imaging-
dc.titleInvestigating the uneven current injection in perovskite-based thin film bipolar resistance switching devices by thermal Imagingen_US
dc.typeArticleen_US
dc.identifier.emailChan, PKL: pklc@hku.hken_US
dc.identifier.authorityChan, PKL=rp01532en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMAG.2013.2293780-
dc.identifier.scopuseid_2-s2.0-84957579992-
dc.identifier.hkuros235691en_US
dc.identifier.volume50en_US
dc.identifier.issue7en_US
dc.identifier.isiWOS:000343034700011-
dc.publisher.placeUnited States-
dc.identifier.issnl0018-9464-

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