Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
---|---|---|---|
Bayesian Neural Network Realization by Exploiting Inherent Stochastic Characteristics of Analog RRAM Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM | 2019 | ||
Uncertainty quantification via a memristor Bayesian deep neural network for risk-sensitive reinforcement learning Journal:Nature Machine Intelligence | 2023 |