Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
---|---|---|---|
Deformation induced complete amorphization at nanoscale in a bulk silicon Journal:AIP Advances | 2019 | ||
Editorial: special issue “ultraprecision 2019” Journal:Applied Nanoscience (Switzerland) | 2021 | ||
Advisor(s):Tse, TH | 2010 |