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Conference Paper: Practical consequences of model misfit

TitlePractical consequences of model misfit
Authors
Zhao, YHambleton, RK
Issue Date2010
PublisherInternational Test Commission (ITC).
Citation
The 7th Conference of the International Test Commission (ITC), Hong Kong, China, 19-21 July 2010 How to Cite?
DescriptionConference Theme: Challenges and Opportunities in Testing and Assessment in a Globalized Economy
Persistent Identifierhttp://hdl.handle.net/10722/187347

 

DC FieldValueLanguage
dc.contributor.authorZhao, Yen_US
dc.contributor.authorHambleton, RKen_US
dc.date.accessioned2013-08-20T12:38:30Z-
dc.date.available2013-08-20T12:38:30Z-
dc.date.issued2010en_US
dc.identifier.citationThe 7th Conference of the International Test Commission (ITC), Hong Kong, China, 19-21 July 2010en_US
dc.identifier.urihttp://hdl.handle.net/10722/187347-
dc.descriptionConference Theme: Challenges and Opportunities in Testing and Assessment in a Globalized Economy-
dc.languageengen_US
dc.publisherInternational Test Commission (ITC).-
dc.relation.ispartofConference of the International Test Commission (ITC)en_US
dc.titlePractical consequences of model misfiten_US
dc.typeConference_Paperen_US
dc.identifier.hkuros216689en_US

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