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Article: Quantitative analysis of titanium-induced artifacts and correlated factors during micro-CT scanning.

TitleQuantitative analysis of titanium-induced artifacts and correlated factors during micro-CT scanning.
Authors
LI, JPow, EHNZheng, LMa, LCheung, LK
KeywordsArtifact
CT Imaging
Dental implant
Micro-CT
Radiology
Issue Date2013
Citation
Clinical Oral Implants Research, 2013, v. 25 n. 4, p. 506-510 How to Cite?
DOI: http://dx.doi.org/10.1111/clr.12200
Persistent Identifierhttp://hdl.handle.net/10722/185574
ISI Accession Number ID
WOS:000332182200014

 

DC FieldValueLanguage
dc.contributor.authorLI, Jen_US
dc.contributor.authorPow, EHNen_US
dc.contributor.authorZheng, Len_US
dc.contributor.authorMa, Len_US
dc.contributor.authorCheung, LKen_US
dc.date.accessioned2013-08-20T11:32:26Z-
dc.date.available2013-08-20T11:32:26Z-
dc.date.issued2013en_US
dc.identifier.citationClinical Oral Implants Research, 2013, v. 25 n. 4, p. 506-510en_US
dc.identifier.urihttp://hdl.handle.net/10722/185574-
dc.languageengen_US
dc.relation.ispartofClinical Oral Implants Researchen_US
dc.subjectArtifact-
dc.subjectCT Imaging-
dc.subjectDental implant-
dc.subjectMicro-CT-
dc.subjectRadiology-
dc.titleQuantitative analysis of titanium-induced artifacts and correlated factors during micro-CT scanning.en_US
dc.typeArticleen_US
dc.identifier.emailPow, EHN: ehnpow@hku.hken_US
dc.identifier.emailZheng, L: lwzheng@hku.hken_US
dc.identifier.emailMa, L: lima@hku.hken_US
dc.identifier.emailCheung, LK: lkcheung@hkucc.hku.hken_US
dc.identifier.authorityPow, EHN=rp00030en_US
dc.identifier.authorityZheng, L=rp01411en_US
dc.identifier.authorityCheung, LK=rp00013en_US
dc.identifier.doi10.1111/clr.12200-
dc.identifier.pmid23745988-
dc.identifier.scopuseid_2-s2.0-84897658467-
dc.identifier.hkuros218211en_US
dc.identifier.isiWOS:000332182200014-

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