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Article: Accuracy and conditioning of the method of moments for the 2D EFIE

TitleAccuracy and conditioning of the method of moments for the 2D EFIE
Authors
Issue Date1999
Citation
Annual Review Of Progress In Applied Computational Electromagnetics, 1999, v. 1, p. 198-204 How to Cite?
AbstractThe condition number scaling for a conducting strip and resonant cavity for the transverse magnetic (TM) and transverse electric (TE) polarizations is given. Three sources of ill-conditioning are identified: increasing discretization density, surface wave self-coupling, and resonance. Changing to a second-kind integral equation eliminates the first two sources, but real resonances still cause ill-conditioning.
Persistent Identifierhttp://hdl.handle.net/10722/182609

 

DC FieldValueLanguage
dc.contributor.authorWarnick, Karl Fen_US
dc.contributor.authorChew, Weng Choen_US
dc.date.accessioned2013-05-02T05:16:06Z-
dc.date.available2013-05-02T05:16:06Z-
dc.date.issued1999en_US
dc.identifier.citationAnnual Review Of Progress In Applied Computational Electromagnetics, 1999, v. 1, p. 198-204en_US
dc.identifier.urihttp://hdl.handle.net/10722/182609-
dc.description.abstractThe condition number scaling for a conducting strip and resonant cavity for the transverse magnetic (TM) and transverse electric (TE) polarizations is given. Three sources of ill-conditioning are identified: increasing discretization density, surface wave self-coupling, and resonance. Changing to a second-kind integral equation eliminates the first two sources, but real resonances still cause ill-conditioning.en_US
dc.languageengen_US
dc.relation.ispartofAnnual Review of Progress in Applied Computational Electromagneticsen_US
dc.titleAccuracy and conditioning of the method of moments for the 2D EFIEen_US
dc.typeArticleen_US
dc.identifier.emailChew, Weng Cho: wcchew@hku.hken_US
dc.identifier.authorityChew, Weng Cho=rp00656en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0032640220en_US
dc.identifier.volume1en_US
dc.identifier.spage198en_US
dc.identifier.epage204en_US
dc.identifier.scopusauthoridWarnick, Karl F=7003381644en_US
dc.identifier.scopusauthoridChew, Weng Cho=36014436300en_US

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