File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

TitleErratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))
Authors
Beinik, IKratzer, MWachauer, AWang, LLechner, RTTeichert, CMotz, CAnwand, WBrauer, GChen, XYHsu, YFDjurišić, AB
Issue Date2012
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2012, v. 112 n. 7, article no. 079903 How to Cite?
DOI: http://dx.doi.org/10.1063/1.4758293
Persistent Identifierhttp://hdl.handle.net/10722/175227
ISSN
0021-8979
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID
WOS:000310489400171
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorBeinik, Ien_US
dc.contributor.authorKratzer, Men_US
dc.contributor.authorWachauer, Aen_US
dc.contributor.authorWang, Len_US
dc.contributor.authorLechner, RTen_US
dc.contributor.authorTeichert, Cen_US
dc.contributor.authorMotz, Cen_US
dc.contributor.authorAnwand, Wen_US
dc.contributor.authorBrauer, Gen_US
dc.contributor.authorChen, XYen_US
dc.contributor.authorHsu, YFen_US
dc.contributor.authorDjurišić, ABen_US
dc.date.accessioned2012-11-26T08:55:01Z-
dc.date.available2012-11-26T08:55:01Z-
dc.date.issued2012en_US
dc.identifier.citationJournal of Applied Physics, 2012, v. 112 n. 7, article no. 079903-
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10722/175227-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.titleErratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))en_US
dc.typeArticleen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1063/1.4758293en_US
dc.identifier.scopuseid_2-s2.0-84867523502en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-84867523502&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume112en_US
dc.identifier.issue7en_US
dc.identifier.spagearticle no. 079903-
dc.identifier.epagearticle no. 079903-
dc.identifier.isiWOS:000310489400171-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridBeinik, I=26040452000en_US
dc.identifier.scopusauthoridKratzer, M=16029145300en_US
dc.identifier.scopusauthoridWachauer, A=52464788200en_US
dc.identifier.scopusauthoridWang, L=52464687400en_US
dc.identifier.scopusauthoridLechner, RT=7005232235en_US
dc.identifier.scopusauthoridTeichert, C=7003900900en_US
dc.identifier.scopusauthoridMotz, C=8955314100en_US
dc.identifier.scopusauthoridAnwand, W=9432786300en_US
dc.identifier.scopusauthoridBrauer, G=7101650540en_US
dc.identifier.scopusauthoridChen, XY=35182594600en_US
dc.identifier.scopusauthoridHsu, YF=26640404800en_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.issnl0021-8979-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats