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Article: Study of DX center in Cd0.8Zn0.2Te:CI by positron annihilation

TitleStudy of DX center in Cd0.8Zn0.2Te:CI by positron annihilation
Authors
Fung, SShan, YYDeng, AHLing, CCBeling, CDLynn, KG
Issue Date1998
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 1998, v. 84 n. 4, p. 1889-1892 How to Cite?
DOI: http://dx.doi.org/10.1063/1.368316
AbstractVariable energy positron beam and positron annihilation lifetime experiments have been carried out to study the DX center in Cd0.8Zn0.2Te:Cl at 50 K. A short positron effective diffusion length of 275±25 Å and a large intensity of 79.0%±0.3% for the long lifetime component indicate a strong trapping effect at DX centers. A trapping rate of κ=1.53±0.05×109 s-1 and a positron lifetime of 335±2 ps at the DX center were obtained. The concentration of DX centers is found to be 5.9 ±0.7×1016 cm-3, which is in good agreement with the results obtained using Hall effect and thermo-electric effect measurements. © 1998 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/174899
ISSN
0021-8979
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID
WOS:000075257700019
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorFung, Sen_HK
dc.contributor.authorShan, YYen_HK
dc.contributor.authorDeng, AHen_HK
dc.contributor.authorLing, CCen_HK
dc.contributor.authorBeling, CDen_HK
dc.contributor.authorLynn, KGen_HK
dc.date.accessioned2012-11-26T08:48:02Z-
dc.date.available2012-11-26T08:48:02Z-
dc.date.issued1998en_HK
dc.identifier.citationJournal of Applied Physics, 1998, v. 84 n. 4, p. 1889-1892-
dc.identifier.issn0021-8979en_HK
dc.identifier.urihttp://hdl.handle.net/10722/174899-
dc.description.abstractVariable energy positron beam and positron annihilation lifetime experiments have been carried out to study the DX center in Cd0.8Zn0.2Te:Cl at 50 K. A short positron effective diffusion length of 275±25 Å and a large intensity of 79.0%±0.3% for the long lifetime component indicate a strong trapping effect at DX centers. A trapping rate of κ=1.53±0.05×109 s-1 and a positron lifetime of 335±2 ps at the DX center were obtained. The concentration of DX centers is found to be 5.9 ±0.7×1016 cm-3, which is in good agreement with the results obtained using Hall effect and thermo-electric effect measurements. © 1998 American Institute of Physics.en_HK
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_HK
dc.relation.ispartofJournal of Applied Physicsen_HK
dc.rightsCopyright 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 1998, v. 84 n. 4, p. 1889-1892 and may be found at https://doi.org/10.1063/1.368316-
dc.titleStudy of DX center in Cd0.8Zn0.2Te:CI by positron annihilationen_HK
dc.typeArticleen_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.emailLing, CC: ccling@hkucc.hku.hken_HK
dc.identifier.emailBeling, CD: cdbeling@hkucc.hku.hken_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.identifier.authorityLing, CC=rp00747en_HK
dc.identifier.authorityBeling, CD=rp00660en_HK
dc.description.naturepublished_or_final_versionen_US
dc.identifier.doi10.1063/1.368316-
dc.identifier.scopuseid_2-s2.0-11644318772en_HK
dc.identifier.hkuros38906-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-11644318772&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume84en_HK
dc.identifier.issue4en_HK
dc.identifier.spage1889en_HK
dc.identifier.epage1892en_HK
dc.identifier.isiWOS:000075257700019-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK
dc.identifier.scopusauthoridShan, YY=7203036700en_HK
dc.identifier.scopusauthoridDeng, AH=7006160354en_HK
dc.identifier.scopusauthoridLing, CC=13310239300en_HK
dc.identifier.scopusauthoridBeling, CD=7005864180en_HK
dc.identifier.scopusauthoridLynn, KG=7102392474en_HK
dc.identifier.issnl0021-8979-

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