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Article: Optical properties of metallic films for vertical-cavity optoelectronic devices

TitleOptical properties of metallic films for vertical-cavity optoelectronic devices
Authors
Issue Date1998
PublisherOptical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfm
Citation
Applied Optics, 1998, v. 37 n. 22, p. 5271-5283 How to Cite?
AbstractWe present models for the optical functions of 11 metals used as mirrors and contacts in optoelectronic and optical devices: noble metals (Ag, Au, Cu), aluminum, beryllium, and transition metals (Cr, Ni, Pd, Pt, Ti, W). We used two simple phenomenological models, the Lorentz-Drude (LD) and the Brendel-Bormann (BB), to interpret both the free-electron and the interband parts of the dielectric response of metals in a wide spectral range from 0.1 to 6 eV. Our results show that the BB model was needed to describe appropriately the interband absorption in noble metals, while for Al, Be, and the transition metals both models exhibit good agreement with the experimental data. A comparison with measurements on surface normal structures confirmed that the reflectance and the phase change on reflection from semiconductor-metal interfaces (including the case of metallic multilayers) can be accurately described by use of the proposed models for the optical functions of metallic films and the matrix method for multilayer calculations. © 1998 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/174640
ISSN
2010 Impact Factor: 1.707
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorRakić, ADen_US
dc.contributor.authorDjurišić, ABen_US
dc.contributor.authorElazar, JMen_US
dc.contributor.authorMajewski, MLen_US
dc.date.accessioned2012-11-26T08:46:38Z-
dc.date.available2012-11-26T08:46:38Z-
dc.date.issued1998en_US
dc.identifier.citationApplied Optics, 1998, v. 37 n. 22, p. 5271-5283en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://hdl.handle.net/10722/174640-
dc.description.abstractWe present models for the optical functions of 11 metals used as mirrors and contacts in optoelectronic and optical devices: noble metals (Ag, Au, Cu), aluminum, beryllium, and transition metals (Cr, Ni, Pd, Pt, Ti, W). We used two simple phenomenological models, the Lorentz-Drude (LD) and the Brendel-Bormann (BB), to interpret both the free-electron and the interband parts of the dielectric response of metals in a wide spectral range from 0.1 to 6 eV. Our results show that the BB model was needed to describe appropriately the interband absorption in noble metals, while for Al, Be, and the transition metals both models exhibit good agreement with the experimental data. A comparison with measurements on surface normal structures confirmed that the reflectance and the phase change on reflection from semiconductor-metal interfaces (including the case of metallic multilayers) can be accurately described by use of the proposed models for the optical functions of metallic films and the matrix method for multilayer calculations. © 1998 Optical Society of America.en_US
dc.languageengen_US
dc.publisherOptical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfmen_US
dc.relation.ispartofApplied Opticsen_US
dc.titleOptical properties of metallic films for vertical-cavity optoelectronic devicesen_US
dc.typeArticleen_US
dc.identifier.emailDjurišić, AB: dalek@hku.hken_US
dc.identifier.authorityDjurišić, AB=rp00690en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0001417397en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0001417397&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume37en_US
dc.identifier.issue22en_US
dc.identifier.spage5271en_US
dc.identifier.epage5283en_US
dc.identifier.isiWOS:000075107300033-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridRakić, AD=35618124100en_US
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_US
dc.identifier.scopusauthoridElazar, JM=6603681404en_US
dc.identifier.scopusauthoridMajewski, ML=7103350030en_US
dc.identifier.issnl0003-6935-

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