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- Publisher Website: 10.1063/1.352082
- Scopus: eid_2-s2.0-0001282904
- WOS: WOS:A1992JX76600035
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Article: A systematic approach to the measurement of ideality factor, series resistance, and barrier height for Schottky diodes
Title | A systematic approach to the measurement of ideality factor, series resistance, and barrier height for Schottky diodes |
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Authors | |
Issue Date | 1992 |
Publisher | American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp |
Citation | Journal of Applied Physics, 1992, v. 72 n. 10, p. 4739-4742 How to Cite? |
Abstract | A nongraphical approach is proposed for measuring and evaluating the ideality n factor and the series resistance of a Schottky diode. The approach involves the use of an auxiliary function and a computer-fitting routine. This technique has been found to be both accurate and reliable. The validity of this has also been confirmed by way of I-V measurements using both commercially available and laboratory-prepared Schottky diodes. |
Persistent Identifier | http://hdl.handle.net/10722/174637 |
ISSN | 2023 Impact Factor: 2.7 2023 SCImago Journal Rankings: 0.649 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Lee, TC | en_HK |
dc.contributor.author | Fung, S | en_HK |
dc.contributor.author | Beling, CD | en_HK |
dc.contributor.author | Au, HL | en_HK |
dc.date.accessioned | 2012-11-26T08:46:38Z | - |
dc.date.available | 2012-11-26T08:46:38Z | - |
dc.date.issued | 1992 | en_HK |
dc.identifier.citation | Journal of Applied Physics, 1992, v. 72 n. 10, p. 4739-4742 | - |
dc.identifier.issn | 0021-8979 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/174637 | - |
dc.description.abstract | A nongraphical approach is proposed for measuring and evaluating the ideality n factor and the series resistance of a Schottky diode. The approach involves the use of an auxiliary function and a computer-fitting routine. This technique has been found to be both accurate and reliable. The validity of this has also been confirmed by way of I-V measurements using both commercially available and laboratory-prepared Schottky diodes. | en_HK |
dc.language | eng | en_US |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp | en_HK |
dc.relation.ispartof | Journal of Applied Physics | en_HK |
dc.title | A systematic approach to the measurement of ideality factor, series resistance, and barrier height for Schottky diodes | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Fung, S: sfung@hku.hk | en_HK |
dc.identifier.email | Beling, CD: cdbeling@hkucc.hku.hk | en_HK |
dc.identifier.authority | Fung, S=rp00695 | en_HK |
dc.identifier.authority | Beling, CD=rp00660 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1063/1.352082 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0001282904 | en_HK |
dc.identifier.volume | 72 | en_HK |
dc.identifier.issue | 10 | en_HK |
dc.identifier.spage | 4739 | en_HK |
dc.identifier.epage | 4742 | en_HK |
dc.identifier.isi | WOS:A1992JX76600035 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Lee, TC=36347141200 | en_HK |
dc.identifier.scopusauthorid | Fung, S=7201970040 | en_HK |
dc.identifier.scopusauthorid | Beling, CD=7005864180 | en_HK |
dc.identifier.scopusauthorid | Au, HL=7004152230 | en_HK |
dc.identifier.citeulike | 11251926 | - |
dc.identifier.issnl | 0021-8979 | - |