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Conference Paper: Robust modeling of constant mean curvature surfaces

TitleRobust modeling of constant mean curvature surfaces
Authors
KeywordsSurface modeling
Constant mean curvature
Mesh quality
Centroidal Voronoi tessellation
Issue Date2012
PublisherAssociation for Computing Machinery, Inc. The Journal's web site is located at http://tog.acm.org
Citation
SIGGRAPH 2012. In ACM Transactions on Graphics, 2012, v. 31 n. 4, article 85, p. 85:1-85:11 How to Cite?
AbstractWe present a new method for modeling discrete constant mean curvature (CMC) surfaces, which arise frequently in nature and are highly demanded in architecture and other engineering applications. Our method is based on a novel use of the CVT (centroidal Voronoi tessellation) optimization framework. We devise a CVT-CMC energy function defined as a combination of an extended CVT energy and a volume functional. We show that minimizing the CVT-CMC energy is asymptotically equivalent to minimizing mesh surface area with a fixed volume, thus defining a discrete CMC surface. The CVT term in the energy function ensures high mesh quality throughout the evolution of a CMC surface in an interactive design process for form finding. Our method is capable of modeling CMC surfaces with fixed or free boundaries and is robust with respect to input mesh quality and topology changes. Experiments show that the new method generates discrete CMC surfaces of improved mesh quality over existing methods.
Persistent Identifierhttp://hdl.handle.net/10722/165851
ISSN
2023 Impact Factor: 7.8
2023 SCImago Journal Rankings: 7.766
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorPan, Hen_US
dc.contributor.authorChoi, YKen_US
dc.contributor.authorLiu, Yen_US
dc.contributor.authorHu, Wen_US
dc.contributor.authorDu, Qen_US
dc.contributor.authorPolthier, Ken_US
dc.contributor.authorZhang, CMen_US
dc.contributor.authorWang, WPen_US
dc.date.accessioned2012-09-20T08:24:33Z-
dc.date.available2012-09-20T08:24:33Z-
dc.date.issued2012en_US
dc.identifier.citationSIGGRAPH 2012. In ACM Transactions on Graphics, 2012, v. 31 n. 4, article 85, p. 85:1-85:11en_US
dc.identifier.issn0730-0301-
dc.identifier.urihttp://hdl.handle.net/10722/165851-
dc.description.abstractWe present a new method for modeling discrete constant mean curvature (CMC) surfaces, which arise frequently in nature and are highly demanded in architecture and other engineering applications. Our method is based on a novel use of the CVT (centroidal Voronoi tessellation) optimization framework. We devise a CVT-CMC energy function defined as a combination of an extended CVT energy and a volume functional. We show that minimizing the CVT-CMC energy is asymptotically equivalent to minimizing mesh surface area with a fixed volume, thus defining a discrete CMC surface. The CVT term in the energy function ensures high mesh quality throughout the evolution of a CMC surface in an interactive design process for form finding. Our method is capable of modeling CMC surfaces with fixed or free boundaries and is robust with respect to input mesh quality and topology changes. Experiments show that the new method generates discrete CMC surfaces of improved mesh quality over existing methods.-
dc.languageengen_US
dc.publisherAssociation for Computing Machinery, Inc. The Journal's web site is located at http://tog.acm.org-
dc.relation.ispartofACM Transactions on Graphicsen_US
dc.rightsACM Transactions on Graphics. Copyright © Association for Computing Machinery, Inc..-
dc.subjectSurface modeling-
dc.subjectConstant mean curvature-
dc.subjectMesh quality-
dc.subjectCentroidal Voronoi tessellation-
dc.titleRobust modeling of constant mean curvature surfacesen_US
dc.typeConference_Paperen_US
dc.identifier.emailChoi, YK: lykchoi@hku.hken_US
dc.identifier.emailWang, WP: wenping@cs.hku.hken_US
dc.identifier.authorityChoi, YK=rp00106en_US
dc.identifier.authorityWang, WP=rp00186en_US
dc.identifier.doi10.1145/2185520.2185581-
dc.identifier.scopuseid_2-s2.0-84872248359-
dc.identifier.hkuros208985en_US
dc.identifier.volume31en_US
dc.identifier.issue4, article 85-
dc.identifier.spage85:1-
dc.identifier.epage85:11-
dc.identifier.eissn1557-7368-
dc.identifier.isiWOS:000308250300061-
dc.publisher.placeUnited States-
dc.identifier.issnl0730-0301-

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