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Conference Paper: Electric currents induced step-like resistive jumps and negative differential resistance in thin films of Nd0.7Sr0.3MnO3

TitleElectric currents induced step-like resistive jumps and negative differential resistance in thin films of Nd0.7Sr0.3MnO3
Authors
Wang, JFWu, ZPGao, J
KeywordsEmergent phenomenon
High density
Inhomogeneities
Interfacial effects
Low temperatures
Issue Date2012
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
56th annual conference on magnetism and magnetic materials / Fundamental properties and cooperative phenomena. In Journal of Applied Physics, 2012, v. 111 n. 7, article no. 07E131 How to Cite?
DOI: http://dx.doi.org/10.1063/1.3675998
AbstractElectric-currents-induced emergent phenomena were found in microbridges of Nd 0.7Sr 0.3MnO 3. After the samples were processed by currents of high densities, a second metal-insulator transition appeared at low temperatures. This resistance peak was very sensitive to weak currents. More salient features were the step-like resistance jumps. At temperatures near these resistance steps, negative differential resistance was observed. Interfacial effects related to electrodes could be ruled out. These effects might be due to current-enhanced inhomogeneity. © 2012 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/164503
ISSN
0021-8979
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID
WOS:000303282401244

 

DC FieldValueLanguage
dc.contributor.authorWang, JFen_US
dc.contributor.authorWu, ZPen_US
dc.contributor.authorGao, Jen_US
dc.date.accessioned2012-09-20T08:02:02Z-
dc.date.available2012-09-20T08:02:02Z-
dc.date.issued2012en_US
dc.identifier.citation56th annual conference on magnetism and magnetic materials / Fundamental properties and cooperative phenomena. In Journal of Applied Physics, 2012, v. 111 n. 7, article no. 07E131-
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10722/164503-
dc.description.abstractElectric-currents-induced emergent phenomena were found in microbridges of Nd 0.7Sr 0.3MnO 3. After the samples were processed by currents of high densities, a second metal-insulator transition appeared at low temperatures. This resistance peak was very sensitive to weak currents. More salient features were the step-like resistance jumps. At temperatures near these resistance steps, negative differential resistance was observed. Interfacial effects related to electrodes could be ruled out. These effects might be due to current-enhanced inhomogeneity. © 2012 American Institute of Physics.-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsCopyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2012, v. 111 n. 7, article no. 07E131 and may be found at https://doi.org/10.1063/1.3675998-
dc.subjectEmergent phenomenon-
dc.subjectHigh density-
dc.subjectInhomogeneities-
dc.subjectInterfacial effects-
dc.subjectLow temperatures-
dc.titleElectric currents induced step-like resistive jumps and negative differential resistance in thin films of Nd0.7Sr0.3MnO3en_US
dc.typeConference_Paperen_US
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0021-8979 (print)&volume=111&spage=07E131&epage=&date=2012&atitle=Electric+currents+induced+step-like+resistive+jumps+and+negative+differential+resistance+in+thin+films+of+Nd0.7Sr0.3MnO3en_US
dc.identifier.emailWang, JF: jfwwang@hku.hken_US
dc.identifier.emailGao, J: jugao@hku.hken_US
dc.identifier.authorityGao, J=rp00699en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.3675998-
dc.identifier.scopuseid_2-s2.0-84861737429-
dc.identifier.hkuros207210en_US
dc.identifier.volume111en_US
dc.identifier.issue7-
dc.identifier.spagearticle no. 07E131-
dc.identifier.epagearticle no. 07E131-
dc.identifier.isiWOS:000303282401244-
dc.publisher.placeUnited States-
dc.identifier.issnl0021-8979-

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