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Article: Methods for fast evaluation of self-energy matrices in tight-binding modeling of electron transport systems

TitleMethods for fast evaluation of self-energy matrices in tight-binding modeling of electron transport systems
Authors
Issue Date2012
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2012, v. 112 n. 1, article no. 013711 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/163989
ISSN
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorHuang, Jen_US
dc.contributor.authorChew, WCen_US
dc.contributor.authorWu, Yen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2012-09-20T07:54:31Z-
dc.date.available2012-09-20T07:54:31Z-
dc.date.issued2012en_US
dc.identifier.citationJournal of Applied Physics, 2012, v. 112 n. 1, article no. 013711-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10722/163989-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp-
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsCopyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2012, v. 112 n. 1, article no. 013711 and may be found at https://doi.org/10.1063/1.4732089-
dc.titleMethods for fast evaluation of self-energy matrices in tight-binding modeling of electron transport systemsen_US
dc.typeArticleen_US
dc.identifier.emailHuang, J: huangjun@eee.hku.hken_US
dc.identifier.emailChew, WC: wcchew@hku.hken_US
dc.identifier.emailWu, Y: ymwu@eee.hku.hken_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityChew, WC=rp00656en_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4732089-
dc.identifier.scopuseid_2-s2.0-84864151877-
dc.identifier.hkuros207526en_US
dc.identifier.volume112en_US
dc.identifier.issue1-
dc.identifier.spagearticle no. 013711-
dc.identifier.epagearticle no. 013711-
dc.identifier.eissn1089-7550-
dc.identifier.isiWOS:000306513400068-
dc.identifier.issnl0021-8979-

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