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Conference Paper: Textile fabric flaw detection using singular value decomposition

TitleTextile fabric flaw detection using singular value decomposition
Authors
Issue Date2010
Citation
1St International Conference On Green Circuits And Systems, Icgcs 2010, 2010, p. 381-386 How to Cite?
AbstractThis paper proposes a textile fabric defect detection method based on the technique of matrix singular value decomposition (SVD). The matrix SVD extracts orthonormal eigen-vectors from training defect-free images of a fabric. These eigen-vectors carry structure features of the given fabric and are expressed in the format of image. For this fabric, the extracted structure features remain unchanged regardless of image sampling position as long as there is no defect. Thus the extracted structure features usually are used in projection based defect detection methods. Compared to model-based projection fabric defect detection methods, the proposed method only assumes that eigen-vectors are independent to each other. The proposed method is assessed with a number of defective fabric images. The results show that the proposed method achieves a high detection rate. In addition, factors related to such an excellent defect detection performance are also discussed. © 2010 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158828
References

 

DC FieldValueLanguage
dc.contributor.authorMak, KLen_US
dc.contributor.authorTian, XWen_US
dc.date.accessioned2012-08-08T09:03:30Z-
dc.date.available2012-08-08T09:03:30Z-
dc.date.issued2010en_US
dc.identifier.citation1St International Conference On Green Circuits And Systems, Icgcs 2010, 2010, p. 381-386en_US
dc.identifier.urihttp://hdl.handle.net/10722/158828-
dc.description.abstractThis paper proposes a textile fabric defect detection method based on the technique of matrix singular value decomposition (SVD). The matrix SVD extracts orthonormal eigen-vectors from training defect-free images of a fabric. These eigen-vectors carry structure features of the given fabric and are expressed in the format of image. For this fabric, the extracted structure features remain unchanged regardless of image sampling position as long as there is no defect. Thus the extracted structure features usually are used in projection based defect detection methods. Compared to model-based projection fabric defect detection methods, the proposed method only assumes that eigen-vectors are independent to each other. The proposed method is assessed with a number of defective fabric images. The results show that the proposed method achieves a high detection rate. In addition, factors related to such an excellent defect detection performance are also discussed. © 2010 IEEE.en_US
dc.languageengen_US
dc.relation.ispartof1st International Conference on Green Circuits and Systems, ICGCS 2010en_US
dc.titleTextile fabric flaw detection using singular value decompositionen_US
dc.typeConference_Paperen_US
dc.identifier.emailMak, KL:makkl@hkucc.hku.hken_US
dc.identifier.authorityMak, KL=rp00154en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/ICGCS.2010.5543033en_US
dc.identifier.scopuseid_2-s2.0-77956586073en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-77956586073&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage381en_US
dc.identifier.epage386en_US
dc.identifier.scopusauthoridMak, KL=7102680226en_US
dc.identifier.scopusauthoridTian, XW=36474217900en_US

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