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Article: Genetic algorithm based defect identification system

TitleGenetic algorithm based defect identification system
Authors
Tam, SMCheung, KC
Issue Date2000
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/eswa
Citation
Expert Systems With Applications, 2000, v. 18 n. 1, p. 17-25 How to Cite?
DOI: http://dx.doi.org/10.1016/S0957-4174(99)00046-9
AbstractA genetic algorithm based defect identification system for machined-parts inspection purposes is developed. It can identify defects from the mass and coordinates of center of mass of a defective part. This method uses genetic algorithm search to find combinations of dimensions that produce the same mass and coordinates of center of mass as the defective part. There is also a knowledge base to store defects that have been identified previously.
Persistent Identifierhttp://hdl.handle.net/10722/156537
ISSN
0957-4174
2021 Impact Factor: 8.665
2020 SCImago Journal Rankings: 1.368
ISI Accession Number ID
WOS:000084945500002
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorTam, SMen_US
dc.contributor.authorCheung, KCen_US
dc.date.accessioned2012-08-08T08:42:51Z-
dc.date.available2012-08-08T08:42:51Z-
dc.date.issued2000en_US
dc.identifier.citationExpert Systems With Applications, 2000, v. 18 n. 1, p. 17-25en_US
dc.identifier.issn0957-4174en_US
dc.identifier.urihttp://hdl.handle.net/10722/156537-
dc.description.abstractA genetic algorithm based defect identification system for machined-parts inspection purposes is developed. It can identify defects from the mass and coordinates of center of mass of a defective part. This method uses genetic algorithm search to find combinations of dimensions that produce the same mass and coordinates of center of mass as the defective part. There is also a knowledge base to store defects that have been identified previously.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/eswaen_US
dc.relation.ispartofExpert Systems with Applicationsen_US
dc.titleGenetic algorithm based defect identification systemen_US
dc.typeArticleen_US
dc.identifier.emailCheung, KC:kccheung@hkucc.hku.hken_US
dc.identifier.authorityCheung, KC=rp01322en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/S0957-4174(99)00046-9en_US
dc.identifier.scopuseid_2-s2.0-0033689774en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0033689774&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume18en_US
dc.identifier.issue1en_US
dc.identifier.spage17en_US
dc.identifier.epage25en_US
dc.identifier.isiWOS:000084945500002-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridTam, SM=7202037309en_US
dc.identifier.scopusauthoridCheung, KC=7402406698en_US
dc.identifier.issnl0957-4174-

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