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Article: High Tc superconducting thin films by rapid thermal annealing of Cu/BaO/Y2O3 layered structures

TitleHigh Tc superconducting thin films by rapid thermal annealing of Cu/BaO/Y2O3 layered structures
Authors
Ma, QYLicata, TJWu, XYang, ESChang, CA
Issue Date1988
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 1988, v. 53 n. 22, p. 2229-2231 How to Cite?
DOI: http://dx.doi.org/10.1063/1.100510
AbstractSuperconducting thin films of YBaCuO have been formed using rapid thermal annealing of Cu/BaO/Y2 O3 layered structures, which were deposited on MgO substrates by electron beam evaporation. The best film has an onset temperature of 94 K and zero resistance at 84 K. The dependence of the film characteristics and superconducting transition temperature on the annealing conditions has been studied. Auger depth profiling was used to examine the interdiffusion between the film and the MgO substrate.
Persistent Identifierhttp://hdl.handle.net/10722/155408
ISSN
0003-6951
2021 Impact Factor: 3.971
2020 SCImago Journal Rankings: 1.182
ISI Accession Number ID
WOS:A1988R011000037

 

DC FieldValueLanguage
dc.contributor.authorMa, QYen_US
dc.contributor.authorLicata, TJen_US
dc.contributor.authorWu, Xen_US
dc.contributor.authorYang, ESen_US
dc.contributor.authorChang, CAen_US
dc.date.accessioned2012-08-08T08:33:20Z-
dc.date.available2012-08-08T08:33:20Z-
dc.date.issued1988en_US
dc.identifier.citationApplied Physics Letters, 1988, v. 53 n. 22, p. 2229-2231-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10722/155408-
dc.description.abstractSuperconducting thin films of YBaCuO have been formed using rapid thermal annealing of Cu/BaO/Y2 O3 layered structures, which were deposited on MgO substrates by electron beam evaporation. The best film has an onset temperature of 94 K and zero resistance at 84 K. The dependence of the film characteristics and superconducting transition temperature on the annealing conditions has been studied. Auger depth profiling was used to examine the interdiffusion between the film and the MgO substrate.en_US
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.titleHigh Tc superconducting thin films by rapid thermal annealing of Cu/BaO/Y2O3 layered structuresen_US
dc.typeArticleen_US
dc.identifier.emailYang, ES:esyang@hkueee.hku.hken_US
dc.identifier.authorityYang, ES=rp00199en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1063/1.100510en_US
dc.identifier.scopuseid_2-s2.0-36549094089en_US
dc.identifier.volume53en_US
dc.identifier.issue22en_US
dc.identifier.spage2229en_US
dc.identifier.epage2231en_US
dc.identifier.isiWOS:A1988R011000037-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridMa, QY=7402815617en_US
dc.identifier.scopusauthoridLicata, TJ=6602391366en_US
dc.identifier.scopusauthoridWu, X=7407065023en_US
dc.identifier.scopusauthoridYang, ES=7202021229en_US
dc.identifier.scopusauthoridChang, CA=7407042938en_US
dc.identifier.issnl0003-6951-

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