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Article: Comment on "change of the emission spectra in organic light-emitting diodes by layer thickness modification" [Appl. Phys. Lett. 85, 2944 (2004)]

TitleComment on "change of the emission spectra in organic light-emitting diodes by layer thickness modification" [Appl. Phys. Lett. 85, 2944 (2004)]
Authors
Issue Date2005
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2005, v. 86 n. 18, article no. 186101, p. 1-2 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/155274
ISSN
2021 Impact Factor: 3.971
2020 SCImago Journal Rankings: 1.182
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorShore, JDen_HK
dc.contributor.authorCheung, CHen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorKwong, CYen_HK
dc.contributor.authorTam, HLen_HK
dc.contributor.authorCheah, KWen_HK
dc.contributor.authorLiu, ZTen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorChui, PCen_HK
dc.contributor.authorChan, Jen_HK
dc.contributor.authorRakić, ADen_HK
dc.date.accessioned2012-08-08T08:32:39Z-
dc.date.available2012-08-08T08:32:39Z-
dc.date.issued2005en_HK
dc.identifier.citationApplied Physics Letters, 2005, v. 86 n. 18, article no. 186101, p. 1-2-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/155274-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.titleComment on "change of the emission spectra in organic light-emitting diodes by layer thickness modification" [Appl. Phys. Lett. 85, 2944 (2004)]en_HK
dc.typeArticleen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.emailChui, PC: pcchui@hkucc.hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.identifier.authorityChui, PC=rp00114en_HK
dc.description.naturelink_to_OA_fulltext-
dc.identifier.doi10.1063/1.1925321en_HK
dc.identifier.scopuseid_2-s2.0-20844448877en_HK
dc.identifier.volume86en_HK
dc.identifier.issue18en_HK
dc.identifier.spagearticle no. 186101, p. 1-
dc.identifier.epagearticle no. 186101, p. 2-
dc.identifier.isiWOS:000229288700062-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridShore, JD=36780468400en_HK
dc.identifier.scopusauthoridCheung, CH=8618960900en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridKwong, CY=35917741900en_HK
dc.identifier.scopusauthoridTam, HL=7101835048en_HK
dc.identifier.scopusauthoridCheah, KW=7102792922en_HK
dc.identifier.scopusauthoridLiu, ZT=22934686400en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridChui, PC=13309913400en_HK
dc.identifier.scopusauthoridChan, J=9234340000en_HK
dc.identifier.scopusauthoridRakić, AD=35618124100en_HK
dc.identifier.issnl0003-6951-

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