On the low-temperature static and dynamic properties of high-performance silicon bipolar transistors

Abstract

In a study performed over the temperature range of 400 to 77 K, Si bipolar transistors were found to have near-ideal characteristics at low temperatures with β as high as 80 at 77 K. Detailed calculations indicate that the conventional theory of the temperature dependence of β does not match the data. The discrepancy can be removed if it is assumed that a phenomenological thermal barrier to hole injection is present. Emitter-coupled logic (ECL) ring oscillators are functional at 85 K with no degradation in speed until about 165 K when compared to 358 K (85°C). Calculations using a delay figure of merit indicate that fT, Rb, and Cc are the delay components most affected by low-temperature operation. The feasibility of reduced logic swing operation of bipolar circuits at low temperatures is examined. It is found that successful ECL circuit operation at reduced logic swings is possible provided emitter resistance is kept small and can be used to enhance low-temperature power-delay performance. These data suggest that conventionally designed high-performance bipolar devices are suitable for the low-temperature environment.