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Article: Analysis of deep beams and shear walls by finite strip method with C0 continuous displacement functions

TitleAnalysis of deep beams and shear walls by finite strip method with C0 continuous displacement functions
Authors
KeywordsC0-Continuous Function
Deep Beam
Finite Strip Method
Shear Wall
Issue Date1998
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/tws
Citation
Thin-Walled Structures, 1998, v. 32 n. 4, p. 289-303 How to Cite?
AbstractThis paper presents a new finite strip method for the analysis of deep beams and shear walls. The essence of the method lies in the adoption of displacement functions possessing the right amount of continuity at the ends as well as at locations of abrupt changes of thickness. The concept of periodic extension in Fourier series is utilized to improve the accuracy of the stresses at the strip ends. The equilibrium conditions at locations of abrupt changes of thickness are taken into account by the incorporation of piecewise linear correction functions. As these displacement functions are built up from harmonic functions with appropriate corrections, they possess both the advantages of fast convergence of harmonic functions as well as appropriate order of continuity. Numerical results also show that the method is versatile, efficient and accurate. © 1998 Elsevier Science Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/150113
ISSN
2023 Impact Factor: 5.7
2023 SCImago Journal Rankings: 1.527
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorCheung, YKen_US
dc.contributor.authorAu, FTKen_US
dc.contributor.authorZheng, DYen_US
dc.date.accessioned2012-06-26T06:01:39Z-
dc.date.available2012-06-26T06:01:39Z-
dc.date.issued1998en_US
dc.identifier.citationThin-Walled Structures, 1998, v. 32 n. 4, p. 289-303en_US
dc.identifier.issn0263-8231en_US
dc.identifier.urihttp://hdl.handle.net/10722/150113-
dc.description.abstractThis paper presents a new finite strip method for the analysis of deep beams and shear walls. The essence of the method lies in the adoption of displacement functions possessing the right amount of continuity at the ends as well as at locations of abrupt changes of thickness. The concept of periodic extension in Fourier series is utilized to improve the accuracy of the stresses at the strip ends. The equilibrium conditions at locations of abrupt changes of thickness are taken into account by the incorporation of piecewise linear correction functions. As these displacement functions are built up from harmonic functions with appropriate corrections, they possess both the advantages of fast convergence of harmonic functions as well as appropriate order of continuity. Numerical results also show that the method is versatile, efficient and accurate. © 1998 Elsevier Science Ltd. All rights reserved.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/twsen_US
dc.relation.ispartofThin-Walled Structuresen_US
dc.subjectC0-Continuous Functionen_US
dc.subjectDeep Beamen_US
dc.subjectFinite Strip Methoden_US
dc.subjectShear Wallen_US
dc.titleAnalysis of deep beams and shear walls by finite strip method with C0 continuous displacement functionsen_US
dc.typeArticleen_US
dc.identifier.emailCheung, YK:hreccyk@hkucc.hku.hken_US
dc.identifier.emailAu, FTK:francis.au@hku.hken_US
dc.identifier.authorityCheung, YK=rp00104en_US
dc.identifier.authorityAu, FTK=rp00083en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/S0263-8231(98)00024-X-
dc.identifier.scopuseid_2-s2.0-0032272695en_US
dc.identifier.hkuros41833-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0032272695&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume32en_US
dc.identifier.issue4en_US
dc.identifier.spage289en_US
dc.identifier.epage303en_US
dc.identifier.isiWOS:000077988200004-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridCheung, YK=7202111065en_US
dc.identifier.scopusauthoridAu, FTK=7005204072en_US
dc.identifier.scopusauthoridZheng, DY=7202567275en_US
dc.identifier.issnl0263-8231-

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