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Article: Variable-time-step TLM algorithm: a unified approach

TitleVariable-time-step TLM algorithm: a unified approach
Authors
KeywordsAlgorithms
Mathematical Models
Issue Date1993
PublisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Citation
Electronics Letters, 1993, v. 29 n. 11, p. 978-979 How to Cite?
AbstractA unified approach to the variable-time-step (VTS) method for transmission-line modelling (TLM) is presented. A generalized VTS TLM algorithm has been developed for both the short- and open-circuited transmission-line segments. The unified approach simplifies the software implementation of VTS TLM algorithms and complements the mathematical approach previously presented.
Persistent Identifierhttp://hdl.handle.net/10722/136926
ISSN
2023 Impact Factor: 0.7
2023 SCImago Journal Rankings: 0.323
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorHui, SYRen_HK
dc.contributor.authorFung, KKen_HK
dc.contributor.authorZhang, MQen_HK
dc.contributor.authorChristopoulos, Cen_HK
dc.date.accessioned2011-07-29T02:13:35Z-
dc.date.available2011-07-29T02:13:35Z-
dc.date.issued1993en_HK
dc.identifier.citationElectronics Letters, 1993, v. 29 n. 11, p. 978-979en_HK
dc.identifier.issn0013-5194en_HK
dc.identifier.urihttp://hdl.handle.net/10722/136926-
dc.description.abstractA unified approach to the variable-time-step (VTS) method for transmission-line modelling (TLM) is presented. A generalized VTS TLM algorithm has been developed for both the short- and open-circuited transmission-line segments. The unified approach simplifies the software implementation of VTS TLM algorithms and complements the mathematical approach previously presented.en_HK
dc.languageengen_US
dc.publisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/ELen_HK
dc.relation.ispartofElectronics Lettersen_HK
dc.subjectAlgorithmsen_US
dc.subjectMathematical Modelsen_US
dc.titleVariable-time-step TLM algorithm: a unified approachen_HK
dc.typeArticleen_HK
dc.identifier.emailHui, SYR:ronhui@eee.hku.hken_HK
dc.identifier.authorityHui, SYR=rp01510en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0027589110en_HK
dc.identifier.volume29en_HK
dc.identifier.issue11en_HK
dc.identifier.spage978en_HK
dc.identifier.epage979en_HK
dc.identifier.isiWOS:A1993LN43900028-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridHui, SYR=7202831744en_HK
dc.identifier.scopusauthoridFung, KK=7202934759en_HK
dc.identifier.scopusauthoridZhang, MQ=7601556629en_HK
dc.identifier.scopusauthoridChristopoulos, C=35510119400en_HK
dc.identifier.issnl0013-5194-

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