Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Back-gate bias dependence of the statistical variability of FDSOI MOSFETs with thin BOX Journal:IEEE Transactions on Electron Devices | 2013 | ||
Statistical variability in scaled generations of n-channel UTB-FD-SOI MOSFETs under the influence of RDF, LER, OTF and MGG Proceeding/Conference:Proceedings - IEEE International SOI Conference | 2012 |