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| Title | Author(s) | Issue Date | |
|---|---|---|---|
First Demonstration of Waferscale Heterogeneous Integration of Ga<inf>2</inf>O<inf>3</inf> MOSFETs on SiC and Si Substrates by Ion-Cutting Process Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM | 2019 |