Browsing by Author XIE, WX

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TitleAuthor(s)Issue Date
 
Effects of trapped charges in gate dielectric and high- k encapsulation on performance of MoS2 transistor
Journal:IEEE Transactions on Electron Devices
XU, JPXIE, WXLIU, LZHAO, XSONG, XLai, PTTANG, WM
2019
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