Browsing by Author Osipowicz, T

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Showing results 1 to 5 of 5
TitleAuthor(s)Issue DateViews
 
Rutherford backscattering analysis of GaN decomposition
Journal:Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
2003
85
 
Stoichiometric and structural alterations in GaN thin films during annealling
Journal:Applied Physics A: Materials Science and Processing
2003
117
A study of the decomposition of GaN during annealing over a wide range of temperatures
Proceeding/Conference:Materials Research Society Symposium - Proceedings
2002
96
 
2003
93
 
Surface analysis of GaN decomposition
Journal:Semiconductor Science and Technology
2002
89