Showing results 1 to 3 of 3
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Electrothermal simulation and thermal performance study of GaN vertical and lateral power transistors Journal:IEEE Transactions on Electron Devices | 2013 | ||
| 2013 | |||
Native and process induced defects in GaN films grown on Si substrates probed using a monoenergetic positron beam Proceeding/Conference:2014 International Workshop on Junction Technology, IWJT 2014 | 2014 |