Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Dynamic breakdown voltage of GaN Power HEMTs Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM | 2020 | ||
Ruggedness of SiC and GaN power transistors in switching based tests Proceeding/Conference:ECS Transactions | 2020 |