Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 7-Jun-2023 | ||
Optically Controlled Ferroelectric Nanodomains for Logic-in-Memory Photonic Devices with Simplified Structures Journal:IEEE Transactions on Electron Devices | 2021 |