Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
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First Demonstration of Waferscale Heterogeneous Integration of Ga<inf>2</inf>O<inf>3</inf> MOSFETs on SiC and Si Substrates by Ion-Cutting Process Proceeding/Conference:Technical Digest - International Electron Devices Meeting, IEDM | 2019 | ||
Preface to Special Issue on Towards High Performance Ga<inf>2</inf>O<inf>3</inf> Electronics: Epitaxial Growth and Power Devices (Ⅰ) Journal:Journal of Semiconductors | 2023 | ||
2023 |