Browsing by Author Chen, Quan

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Showing results 1 to 5 of 5
TitleAuthor(s)Issue Date
 
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing
Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
7-Jun-2023
 
21-Oct-2022
 
Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires
Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
1-Feb-2023
 
2016
 
2010