Showing results 5 to 6 of 6
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Title | Author(s) | Issue Date | |
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New reliability mechanisms in memory design for sub-22nm technologies Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011 | 2011 | ||
Quantum Wires and Waveguides Formed in Graphene by Strain Journal:Nano Letters | 2018 |