Showing results 6 to 7 of 7
< previous
| Title | Author(s) | Issue Date | |
|---|---|---|---|
New reliability mechanisms in memory design for sub-22nm technologies Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011 | 2011 | ||
On the sub-nm EOT scaling of high-κ gate stacks Proceeding/Conference:ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon | 2008 |