Browsing by Author Asenov, A.

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Showing results 6 to 7 of 7 < previous 
TitleAuthor(s)Issue Date
New reliability mechanisms in memory design for sub-22nm technologies
Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011
2011
On the sub-nm EOT scaling of high-κ gate stacks
Proceeding/Conference:ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon
2008