Showing results 2 to 4 of 4
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Title | Author(s) | Issue Date | |
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Observation of the ambient effect in BTI characteristics of back-gated single layer graphene field effect transistors Journal:IEEE Transactions on Electron Devices | 2013 | ||
Positive bias-induced V<inf>th</inf> instability in graphene field effect transistors Journal:IEEE Electron Device Letters | 2012 | ||
V<inf>th</inf> shift in single-layer graphene field-effect transistors and its correlation with raman inspection Journal:IEEE Transactions on Device and Materials Reliability | 2012 |