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Conference Paper: A new control chart for high yield processes

TitleA new control chart for high yield processes
Authors
Issue Date1997
Persistent Identifierhttp://hdl.handle.net/10722/99959

 

DC FieldValueLanguage
dc.contributor.authorChan, PLYen_HK
dc.contributor.authorXie, Men_HK
dc.contributor.authorGoh, TNen_HK
dc.date.accessioned2010-09-25T18:51:12Z-
dc.date.available2010-09-25T18:51:12Z-
dc.date.issued1997en_HK
dc.identifier.urihttp://hdl.handle.net/10722/99959-
dc.languageengen_HK
dc.relation.ispartofProceedings of the Third ISSAT International Conference on Reliability and Quality in Design, Anaheim, California, March 12-14, 1997en_HK
dc.titleA new control chart for high yield processesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChan, PLY: plychan@hku.hken_HK
dc.identifier.authorityChan, PLY=rp00093en_HK
dc.identifier.hkuros28359en_HK

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