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Conference Paper: A new control chart for high yield processes

TitleA new control chart for high yield processes
Authors
Chan, PLYXie, MGoh, TN
Issue Date1997
Citation
The 3rd ISSAT International Conference on Reliability and Quality in Design, Anaheim, CA, 12-14 March 1997 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/99959

 

DC FieldValueLanguage
dc.contributor.authorChan, PLYen_HK
dc.contributor.authorXie, Men_HK
dc.contributor.authorGoh, TNen_HK
dc.date.accessioned2010-09-25T18:51:12Z-
dc.date.available2010-09-25T18:51:12Z-
dc.date.issued1997en_HK
dc.identifier.citationThe 3rd ISSAT International Conference on Reliability and Quality in Design, Anaheim, CA, 12-14 March 1997-
dc.identifier.urihttp://hdl.handle.net/10722/99959-
dc.languageengen_HK
dc.relation.ispartofISSAT International Conference on Reliability and Quality in Designen_HK
dc.titleA new control chart for high yield processesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChan, PLY: plychan@hku.hken_HK
dc.identifier.authorityChan, PLY=rp00093en_HK
dc.identifier.hkuros28359en_HK

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