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Conference Paper: Characterization of bottom-viewed inductively coupled plasma atomic emission spectrometry

TitleCharacterization of bottom-viewed inductively coupled plasma atomic emission spectrometry
Authors
Issue Date2003
Citation
Singapore International Conference 3: Frontiers in Physical and Analytical Chemistry, 15-17 December 2003, Singapore, p. O15 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/97141

 

DC FieldValueLanguage
dc.contributor.authorChan, WTen_HK
dc.contributor.authorChan, CYGen_HK
dc.contributor.authorCheung, WKAen_HK
dc.date.accessioned2010-09-25T16:57:57Z-
dc.date.available2010-09-25T16:57:57Z-
dc.date.issued2003en_HK
dc.identifier.citationSingapore International Conference 3: Frontiers in Physical and Analytical Chemistry, 15-17 December 2003, Singapore, p. O15en_HK
dc.identifier.urihttp://hdl.handle.net/10722/97141-
dc.languageengen_HK
dc.relation.ispartofSingapore International Conference 3: Frontiers in Physical and Analytical Chemistry, 15-17 December 2003, Singaporeen_HK
dc.titleCharacterization of bottom-viewed inductively coupled plasma atomic emission spectrometryen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChan, WT: wtchan@hku.hken_HK
dc.identifier.authorityChan, WT=rp00668en_HK
dc.identifier.hkuros114311en_HK
dc.identifier.spage15en_HK

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