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Collection's Items (Sorted by Submit Date in Descending order): 1 to 20 of 1682
TitleAuthor(s)Issue DateViews
2012
2008
 
Developing Chemical Approaches to Examine Histone Posttranslational Modifications
Proceeding/Conference:The Croucher Foundation Advanced Study Institute
2013
 
Developing Chemical Approaches to Examine Histone Posttranslational Modifications
Proceeding/Conference:Challenges in Chemical Biology (ISACS11)
2013
 
Chemical Proteomics Approaches to Examine Histone Posttranslational Modifications
Proceeding/Conference:The 8th Sino-US Chemistry Professors Conference
2012
 
2014
 
Developing Chemical Approaches to Examine Histone Posttranslational Modifications
Proceeding/Conference:Sino-German Frontiers of Chemistry Symposium
2014
 
Chemical proteomics approaches to examine protein posttranslational modifications (PTMs)
Proceeding/Conference:2012 Cross Strait Chemical Biology Conference
2012
 
Chemical Approaches to Study Epigenetic Modifications
Proceeding/Conference:The University of Hong Kong & University of Liverpool Symposium
2014
 
Integrative chemical biology approaches to examine histone posttranslational modifications
Proceeding/Conference:The 3rd Asian Chemical Biology Conference
2014
2012
1
2013
1
Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2013
4
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2013
2
A mobility model correction for 'atomistic' drift-diffusion simulation
Proceeding/Conference:International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
2011
4
Statistical variability in n-channel UTB-FD-SOI MOSFETs under the influence of RDF, LER, MGG and PBTI
Proceeding/Conference:Proceedings - IEEE International SOI Conference
2011
2
2012
1
2010
2
New reliability mechanisms in memory design for sub-22nm technologies
Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011
2011
2
3D dynamic RTN simulation of a 25nm MOSFET: The importance of variability in reliability evaluation of decananometer devices
Proceeding/Conference:2012 15th International Workshop on Computational Electronics, IWCE 2012
2012
6
Collection's Items (Sorted by Submit Date in Descending order): 1 to 20 of 1682