Conference Paper: Analysis of the mould void problems by statistical process control on a 28x28mm Quad-Flat-Package integrating circuit

File Download
Supplementary

  • Basic View
  • Metadata View
  • XML View
TitleAnalysis of the mould void problems by statistical process control on a 28x28mm Quad-Flat-Package integrating circuit
AuthorsLau, RMH
Wong, ACY
Issue Date1994
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000405
CitationThe 3rd International Symposium on Consumer Electronics, Hong Kong Convention & Exhibition Centre, Hong Kong, 14-16 November 1994, p. 400-404 [How to Cite?]
DC Field
Value
dc.contributor.authorLau, RMH
dc.contributor.authorWong, ACY
dc.date.accessioned2009-04-03T07:36:25Z
dc.date.available2009-04-03T07:36:25Z
dc.date.issued1994
dc.description.naturepublished_or_final_version
dc.identifier.citationThe 3rd International Symposium on Consumer Electronics, Hong Kong Convention & Exhibition Centre, Hong Kong, 14-16 November 1994, p. 400-404 [How to Cite?]
dc.identifier.hkuros1833
dc.identifier.urihttp://hdl.handle.net/10722/54088
dc.languageeng
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000405
dc.rights©1994 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
dc.titleAnalysis of the mould void problems by statistical process control on a 28x28mm Quad-Flat-Package integrating circuit
dc.typeConference_Paper